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Orientation of graphitic planes during the bias-enhanced nucleation of diamond on silicon: An x-ray absorption near-edge study

机译：金刚石在硅上的偏斜增强形核过程中石墨平面的取向：X射线吸收近边缘研究

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3 pages, 2 figures.

机译：3页2图。

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作者
Jiménez Guerrero, Ignacio; García Hernández, M.; Albella, J. M.; Terminello, Louis J.;
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年度 1998
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原文格式 PDF
正文语种 eng
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4. Two-dimensional graphite-like Si_xC observed by polarization dependence in the near-edge X-ray absorption fine structure [C] . Yuji Baba, Iwao Shimoyama, Tetsuhiro Sekiguchi International Symposium on Material Chemistry in Nuclear Environment . 2003

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5. Characterization of functionalized self-assembled monolayers and surface-attached interlocking molecules using near-edge X-ray absorption fine structure spectroscopy. [D] . Willey, Trevor Michael. 2004

机译：使用近边缘X射线吸收精细结构光谱表征功能化的自组装单分子层和表面连接的互锁分子。
6. Multiplexed Orientation and Structure Analysis by Imaging Near-Edge X-ray Absorption Fine Structure (MOSAIX) for Combinatorial Surface Science [O] . Joe E. Baio, Cherno Jaye, Daniel A. Fischer, -1

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7. X-ray absorption spectroscopy and atomic force microscopy study of bias-enhanced nucleation of diamond films [O] . García Hernández, M., Jiménez Guerrero, Ignacio, Vázquez, Luis, 1998

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8. Study of hard disk and slider surfaces using X-ray photoemission electron microscopy and near-edge X-ray absorption fine structure spectroscopy [R] . Anders, S. , Stammler, T. , Bhatia, C. S. , 1998

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Orientation of graphitic planes during the bias-enhanced nucleation of diamond on silicon: An x-ray absorption near-edge study

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